Black Box Model Analysis for Industrial Fault Monitoring

  1. Galve, S.
  2. Vilajosana, X.
  3. Puig, V.
Proceedings:
IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

ISSN: 1946-0759,  1946-0740

ISBN: 9798350339918

Year of publication: 2023

2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation, ETFA 2023

Volume: 2023-September

Type: Conference paper

DOI: 10.1109/ETFA54631.2023.10275467 GOOGLE SCHOLAR
Data source: Scopus